Bruker Announces Major Advances in Detector Technology for Semiconductor, Thin Film, Energy Materials and Nanostructure Characterization

Bruker today announced the launch of two groundbreaking detectors at Microscopy & Microanalysis (M&M) 2026: the eWARP™ TKD, a next-generation Transmission Kikuchi Diffraction (TKD) detector for nanoscale crystallographic characterization, and the XFlash® FlatQUAD™ 2L, the latest evolution of Bruker’s annular EDS detector, enabling simultaneous Energy Dispersive X-ray Spectroscopy (EDS) and Back-Scattered Electron (BSE) detection.

• Source: https://www.azom.com/news.aspx?newsID=65749