Bruker Drives Major Advances in Detector Technology for Semiconductor and Nanostructure Analysis

Bruker today announced the launch of the XFlash® 7200 FIRE, the world’s first inclined large-area Energy-Dispersive Spectroscopy (EDS) detector for Scanning Electron Microscopy (SEM) built on Bruker’s revolutionary four-segment Silicon Drift Detector (SDD) architecture.

• Source: https://www.azom.com/news.aspx?newsID=65753