Tescan Launches Orage™ 2 Ga+ FIB-SEM for Materials Science, Setting New Standard in Automated TEM Sample Preparation

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Date:

May 28, 2026

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Tescan announces the launch of Orage™ 2, a next-generation Ga+ FIB-SEM column integrated into the AMBER 2 platform for advanced materials science applications.

Source: https://www.azom.com/news.aspx?newsID=65483

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Materials Industry

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Tescan Launches Orage™ 2 Ga+ FIB-SEM for Materials Science, Setting New Standard in Automated TEM Sample Preparation

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