Twisting Perovskite Interfaces Slows Ion Migration and Improves Device Stability

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Researchers used atomic-resolution imaging and simulations to show how twist angle alters halide-ion migration across CsPbBr3–CsPbCl3 perovskite heterostructures by changing the formation of interfacial diffusion channels. A 28° twist delayed interdiffusion, reduced the diffusion-channel ratio by more than 60%, and improved photodetector stability under accelerated thermal testing.

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