CRAIC Technologies Introduces Updated 508PV™ Microscope Spectrophotometer for Semiconductor Metrology

CRAIC Technologies, the global leader in UV-Visible-NIR microspectroscopy, today announced significant technology updates to the 508PV™ Microscope Spectrophotometer, designed to meet the precision demands of semiconductor fabs and R&D laboratories.

• Source: https://www.azom.com/news.aspx?newsID=65183